
1 UDT Sensors Inc. Phone: 310-978-0516 Fax: 310-644-1727 http:\\www.udt.com
UV ENHANCED SERIES
INVERSION LAYERS AND PLANAR DIFFUSED SILICON PHOTODIODES
UDT Sensors offers two distinct families of UV enhanced silicon photodiodes.
Inversion channel series and planar diffused series. Both families of devices
are especially designed for low noise detection in the UV region of electromag-
netic spectrum.
Inversion layer structure UV enhanced photodiodes exhibit 100% internal quan-
tum efficiency and are well suited for low intensity light measurements. They
have high shunt resistance, low noise and high breakdown voltages. The re-
sponse uniformity across the surface and quantum efficiency improves with 5
to 10 volts applied reverse bias. In photovoltaic mode (unbiased), the capaci-
tance is higher than diffused devices but decreases rapidly with an applied
reverse bias. Photocurrent non-linearity sets in at lower photocurrents for in-
version layer devices compared to the diffused ones. They represent highly
stable responsivity under temperature changes up to 700 nm.
Planar diffused structure UV enhanced photodiodes show significant advan-
tages over inversion layer devices, such as lower capacitance and higher re-
sponse time. These devices exhibit linearity of photocurrent up to higher light
• Pollution Monitoring • Inversion series:
• Medical Instrumentation 100% Internal QE
• UV Exposure Meters • Ultra High RSH
• Spectroscopy • Planar Diffused Series:
• Water Purification IR Suppressed
• Fluorescence High Speed Response
High Stability
• Excellent UV response
APPLICATIONS FEATURES
input power compared to inversion layer devices.
They have relatively lower responsivities and quantum efficiencies compared
to inversion layer devices. There are two types of planar diffused UV en-
hanced photodiodes available: UVD and UVE. Both series have almost simi-
lar electro-optical characteristics, except in the UVE series, where the near IR
responses of the devices are suppressed. This is especially desirable if block-
ing the near IR region of the spectrum is necessary . UVD devices peak at 970
nm and UVE devices at 720 nm (see graph). Both series may be biased for
lower capacitance, faster response and wider dynamic range. Or they may be
operated in the photovoltaic (unbiased) mode for applications requiring low
drift with temperature variations. The UVE devices have a higher shunt resis-
tance than their counterparts of UVD devices, but have a higher capacitance.
These detectors are ideal for coupling to an OP-AMP in the current mode con-
figuration as shown below .
For further details, refer to the “Photodiode Characteristics” section of the catalog.
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+
R
f
C
f
A
1
R
0
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+
A
2
R
2
R
1
V
out
0.1µF
-15V
0.1µF
-15V
+15V
0.1µF
+15V
0.1µF